Analysis of the NAND Flash device garbage collection algorithms under lack of memory conditions

Zaitsev, I.; Zalivaka, S.

Please use this identifier to cite or link to this item: https://elib.psu.by/handle/123456789/29818

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DC Field	Value	Language
dc.contributor.author	Zaitsev, I.	en
dc.contributor.author	Zalivaka, S.	en
dc.date.accessioned	2022-02-25T07:16:34Z	-
dc.date.available	2022-02-25T07:16:34Z	-
dc.date.issued	2021	-
dc.identifier.citation	Zaitsev, I. Analysis of the NAND Flash device garbage collection algorithms under lack of memory conditions / I. Zaitsev, S. Zalivaka // European and National Dimension in Research = Европейский и национальный контексты в научных исследованиях : electronic collected materials of XIII Junior Researchers' Conference, Novopolotsk, May 17-21, 2021 : in 3 parts / Ministry of Education of Belarus, Polotsk State University ; ed. Dr. Yury Holubeu [et al.]. - Novopolotsk : PSU, 2021. - Part 3 : Technology. - P. 116-119.	ru
dc.identifier.uri	https://elib.psu.by/handle/123456789/29818	-
dc.description.abstract	A number of existing packages of applied programs for computer modeling of electron-optical systems of sources of charged particles built on the basis of analytical synthesis models and numerical methods of analysis are considered. The analysis of the main advantages and disadvantages of the packages MAGIC, MAFIA, CEM, KARAT, POISSON, TAU, ERA, BEAMCAD and their functionality is carried out.	ru_RU
dc.language.iso	en	ru_RU
dc.publisher	Полоцкий государственный университет	ru_RU
dc.title	Analysis of the NAND Flash device garbage collection algorithms under lack of memory conditions	ru_RU
dc.type	Article	ru_RU
Appears in Collections:	European and National Dimension in Research. Technology. 2021

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